Wei-Hao Hsiao, Nian-Jia Wang, Ming-Yi Lee, Li-Kuang Kuo, Ding-Jhang Lin, Yen-Hai Chao, Chih-Yuan Lu. Modeling of Apparent Activation Energy and Lifetime Estimation for Retention of 3D SGVC Memory. In IEEE International Reliability Physics Symposium, IRPS 2019, Monterey, CA, USA, March 31 - April 4, 2019. pages 1-5, IEEE, 2019. [doi]
Abstract is missing.