Reduction of errors due to source and meter in the nonlinearity test

Luke S. L. Hsieh. Reduction of errors due to source and meter in the nonlinearity test. In Proceedings IEEE International Test Conference 1998, Washington, DC, USA, October 18-22, 1998. pages 254-257, IEEE Computer Society, 1998. [doi]

Authors

Luke S. L. Hsieh

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