Luke S. L. Hsieh. Reduction of errors due to source and meter in the nonlinearity test. In Proceedings IEEE International Test Conference 1998, Washington, DC, USA, October 18-22, 1998. pages 254-257, IEEE Computer Society, 1998. [doi]
@inproceedings{Hsieh98:1,
title = {Reduction of errors due to source and meter in the nonlinearity test},
author = {Luke S. L. Hsieh},
year = {1998},
url = {http://www.computer.org/proceedings/itc/5093/50930254abs.htm},
tags = {testing, source-to-source, peer-to-peer, open-source},
researchr = {https://researchr.org/publication/Hsieh98%3A1},
cites = {0},
citedby = {0},
pages = {254-257},
booktitle = {Proceedings IEEE International Test Conference 1998, Washington, DC, USA, October 18-22, 1998},
publisher = {IEEE Computer Society},
isbn = {0-7803-5093-6},
}