Tong-Yu Hsieh, Melvin A. Breuer, Murali Annavaram, Sandeep K. Gupta, Kuen-Jong Lee. Tolerance of performance degrading faults for effective yield improvement. In Gordon W. Roberts, Bill Eklow, editors, 2009 IEEE International Test Conference, ITC 2009, Austin, TX, USA, November 1-6, 2009. pages 1-10, IEEE, 2009. [doi]
@inproceedings{HsiehBAGL09,
title = {Tolerance of performance degrading faults for effective yield improvement},
author = {Tong-Yu Hsieh and Melvin A. Breuer and Murali Annavaram and Sandeep K. Gupta and Kuen-Jong Lee},
year = {2009},
doi = {10.1109/TEST.2009.5355594},
url = {http://dx.doi.org/10.1109/TEST.2009.5355594},
researchr = {https://researchr.org/publication/HsiehBAGL09},
cites = {0},
citedby = {0},
pages = {1-10},
booktitle = {2009 IEEE International Test Conference, ITC 2009, Austin, TX, USA, November 1-6, 2009},
editor = {Gordon W. Roberts and Bill Eklow},
publisher = {IEEE},
isbn = {978-1-4244-4868-5},
}