Tong-Yu Hsieh, Melvin A. Breuer, Murali Annavaram, Sandeep K. Gupta, Kuen-Jong Lee. Tolerance of performance degrading faults for effective yield improvement. In Gordon W. Roberts, Bill Eklow, editors, 2009 IEEE International Test Conference, ITC 2009, Austin, TX, USA, November 1-6, 2009. pages 1-10, IEEE, 2009. [doi]
Abstract is missing.