A Physical-Location-Aware X-Filling Method for IR-Drop Reduction in At-Speed Scan Test

Wen-Wen Hsieh, S. L. Chen, I-Sheng Lin, TingTing Hwang. A Physical-Location-Aware X-Filling Method for IR-Drop Reduction in At-Speed Scan Test. IEEE Trans. on CAD of Integrated Circuits and Systems, 29(2):289-298, 2010. [doi]

Abstract

Abstract is missing.