E. R. Hsieh, J. K. Chang, T. Y. Tang, Y. J. Li, C. W. Liang, M. Y. Lin, S.-Y. Huang, C. J. Su, J.-C. Guo, Steve S. Chung. 10 Cycles of Endurance, and Decade Lifetime at 103 °C. In IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits 2022), Honolulu, HI, USA, June 12-17, 2022. pages 359-360, IEEE, 2022. [doi]
Abstract is missing.