Reduction of detected acceptable faults for yield improvement via error-tolerance - researchr publication authors

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Tong-Yu Hsieh, Kuen-Jong Lee, Melvin A. Breuer. Reduction of detected acceptable faults for yield improvement via error-tolerance. In Rudy Lauwereins, Jan Madsen, editors, 2007 Design, Automation and Test in Europe Conference and Exposition (DATE 2007), April 16-20, 2007, Nice, France. pages 1599-1604, ACM, 2007. [doi]

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