Tong-Yu Hsieh, Kuen-Jong Lee, Melvin A. Breuer. Reduction of detected acceptable faults for yield improvement via error-tolerance. In Rudy Lauwereins, Jan Madsen, editors, 2007 Design, Automation and Test in Europe Conference and Exposition (DATE 2007), April 16-20, 2007, Nice, France. pages 1599-1604, ACM, 2007. [doi]
@inproceedings{HsiehLB07, title = {Reduction of detected acceptable faults for yield improvement via error-tolerance}, author = {Tong-Yu Hsieh and Kuen-Jong Lee and Melvin A. Breuer}, year = {2007}, doi = {10.1145/1266366.1266717}, url = {http://doi.acm.org/10.1145/1266366.1266717}, researchr = {https://researchr.org/publication/HsiehLB07}, cites = {0}, citedby = {0}, pages = {1599-1604}, booktitle = {2007 Design, Automation and Test in Europe Conference and Exposition (DATE 2007), April 16-20, 2007, Nice, France}, editor = {Rudy Lauwereins and Jan Madsen}, publisher = {ACM}, isbn = {978-3-9810801-2-4}, }