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Software-hardware-cooperated built-in self-test scheme for channel-based DRAMs

Tsung-Fu Hsieh, Jin-Fu Li, Kuan-Te Wu, Jenn-Shiang Lai, Chih-Yen Lo, Ding-Ming Kwai, Yung-Fa Chou. Software-hardware-cooperated built-in self-test scheme for channel-based DRAMs. In International Test Conference in Asia, ITC-Asia 2017, Taipei, Taiwan, September 13-15, 2017. pages 107-111, IEEE, 2017. [doi]

Authors

Tsung-Fu Hsieh

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Jin-Fu Li

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Kuan-Te Wu

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Jenn-Shiang Lai

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Chih-Yen Lo

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Ding-Ming Kwai

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Yung-Fa Chou

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