An Intelligent Factory Automation System With Multivariate Time Series Algorithm for Chip Probing Process

Yu-Ming Hsieh, Chin-Yi Lin, Jan Wilch, Birgit Vogel-Heuser, Yu-Chen Lin, Yu-Chuan Lin, Min-Hsiung Hung, Fan-Tien Cheng. An Intelligent Factory Automation System With Multivariate Time Series Algorithm for Chip Probing Process. IEEE Robotics and Automation Letters, 8(9):5464-5471, September 2023. [doi]

Abstract

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