Chun-Kai Hsu, Li-Ming Denq, Mao-Yin Wang, Jing-Jia Liou, Chih-Tsun Huang, Cheng-Wen Wu. Area and Test Cost Reduction for On-Chip Wireless Test Channels with System-Level Design Techniques. In 17th IEEE Asian Test Symposium, ATS 2008, Sapporo, Japan, November 24-27, 2008. pages 245-250, IEEE Computer Society, 2008. [doi]
Abstract is missing.