Fault-Pattern Oriented Defect Diagnosis for Flash Memory - researchr publication authors

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Mu-Hsien Hsu, Yu-Tsao Hsing, Jen-Chieh Yeh, Cheng-Wen Wu. Fault-Pattern Oriented Defect Diagnosis for Flash Memory. In 14th IEEE International Workshop on Memory Technology, Design, and Testing (MTDT 2006), 2-4 August 2006, Taipei, Taiwan. pages 3-8, IEEE Computer Society, 2006. [doi]

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