Mu-Hsien Hsu, Yu-Tsao Hsing, Jen-Chieh Yeh, Cheng-Wen Wu. Fault-Pattern Oriented Defect Diagnosis for Flash Memory. In 14th IEEE International Workshop on Memory Technology, Design, and Testing (MTDT 2006), 2-4 August 2006, Taipei, Taiwan. pages 3-8, IEEE Computer Society, 2006. [doi]
@inproceedings{HsuHYW06,
title = {Fault-Pattern Oriented Defect Diagnosis for Flash Memory},
author = {Mu-Hsien Hsu and Yu-Tsao Hsing and Jen-Chieh Yeh and Cheng-Wen Wu},
year = {2006},
doi = {10.1109/MTDT.2006.13},
url = {http://doi.ieeecomputersociety.org/10.1109/MTDT.2006.13},
researchr = {https://researchr.org/publication/HsuHYW06},
cites = {0},
citedby = {0},
pages = {3-8},
booktitle = {14th IEEE International Workshop on Memory Technology, Design, and Testing (MTDT 2006), 2-4 August 2006, Taipei, Taiwan},
publisher = {IEEE Computer Society},
isbn = {0-7695-2572-5},
}