Rule Generation for Classifying SLT Failed Parts

Ho-Chieh Hsu, Cheng-Che Lu, Shih-Wei Wang, Kelly Jones, Kai-Chiang Wu, Mango C.-T. Chao. Rule Generation for Classifying SLT Failed Parts. In 40th IEEE VLSI Test Symposium, VTS 2022, San Diego, CA, USA, April 25-27, 2022. pages 1-7, IEEE, 2022. [doi]

Authors

Ho-Chieh Hsu

This author has not been identified. Look up 'Ho-Chieh Hsu' in Google

Cheng-Che Lu

This author has not been identified. Look up 'Cheng-Che Lu' in Google

Shih-Wei Wang

This author has not been identified. Look up 'Shih-Wei Wang' in Google

Kelly Jones

This author has not been identified. Look up 'Kelly Jones' in Google

Kai-Chiang Wu

This author has not been identified. Look up 'Kai-Chiang Wu' in Google

Mango C.-T. Chao

This author has not been identified. Look up 'Mango C.-T. Chao' in Google