Ho-Chieh Hsu, Cheng-Che Lu, Shih-Wei Wang, Kelly Jones, Kai-Chiang Wu, Mango C.-T. Chao. Rule Generation for Classifying SLT Failed Parts. In 40th IEEE VLSI Test Symposium, VTS 2022, San Diego, CA, USA, April 25-27, 2022. pages 1-7, IEEE, 2022. [doi]
Abstract is missing.