Xuan Hu, Joseph S. Friedman. Transient model with interchangeability for dual-gate ambipolar CNTFET logic design. In IEEE/ACM International Symposium on Nanoscale Architectures, NANOARCH 2017, Newport, RI, USA, July 25-26, 2017. pages 61-66, IEEE, 2017. [doi]
Abstract is missing.