Dyi-Chung Hu, Hirohito Hashimoto, Li-Fong Tseng, Ken Chau-Cheung Cheng, Katherine Shu-Min Li, Sying-Jyan Wang, Sean Y.-S. Chen, Jwu E. Chen, Clark Liu, Andrew Yi-Ann Huang. Innovative Practice on Wafer Test Innovations. In 38th IEEE VLSI Test Symposium, VTS 2020, San Diego, CA, USA, April 5-8, 2020. pages 1, IEEE, 2020. [doi]
Abstract is missing.