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Fast statistical model of TiO2 thin-film memristor and design implication

Miao Hu, Hai Li, Robinson E. Pino. Fast statistical model of TiO2 thin-film memristor and design implication. In 2011 IEEE/ACM International Conference on Computer-Aided Design (ICCAD), San Jose, California, USA, November 7-10, 2011. pages 345-352, IEEE, 2011. [doi]

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Miao Hu

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Hai Li

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Robinson E. Pino

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