Fast statistical model of TiO2 thin-film memristor and design implication

Miao Hu, Hai Li, Robinson E. Pino. Fast statistical model of TiO2 thin-film memristor and design implication. In 2011 IEEE/ACM International Conference on Computer-Aided Design (ICCAD), San Jose, California, USA, November 7-10, 2011. pages 345-352, IEEE, 2011. [doi]

@inproceedings{HuLP11,
  title = {Fast statistical model of TiO2 thin-film memristor and design implication},
  author = {Miao Hu and Hai Li and Robinson E. Pino},
  year = {2011},
  doi = {10.1109/ICCAD.2011.6105353},
  url = {http://dx.doi.org/10.1109/ICCAD.2011.6105353},
  researchr = {https://researchr.org/publication/HuLP11},
  cites = {0},
  citedby = {0},
  pages = {345-352},
  booktitle = {2011 IEEE/ACM International Conference on Computer-Aided Design (ICCAD), San Jose, California, USA, November 7-10, 2011},
  publisher = {IEEE},
  isbn = {978-1-4577-1399-6},
}