Test Scheduling for Network-on-Chip Using XY-Direction Connected Subgraph Partition and Multiple Test Clocks

Cong Hu, Zhi Li, Chuan-pei Xu, Mengyi Jia. Test Scheduling for Network-on-Chip Using XY-Direction Connected Subgraph Partition and Multiple Test Clocks. J. Electronic Testing, 32(1):31-42, 2016. [doi]

Abstract

Abstract is missing.