Simultaneous information flow security and circuit redundancy in Boolean gates

Wei Hu, Jason Oberg, Dejun Mu, Ryan Kastner. Simultaneous information flow security and circuit redundancy in Boolean gates. In 2012 IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2012, San Jose, CA, USA, November 5-8, 2012. pages 585-590, IEEE, 2012. [doi]

Abstract

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