Simulation of Closely Related Dynamic Nonlinear Systems With Application to Process-Voltage-Temperature Corner Analysis

Bo Hu, C.-J. Richard Shi. Simulation of Closely Related Dynamic Nonlinear Systems With Application to Process-Voltage-Temperature Corner Analysis. IEEE Trans. on CAD of Integrated Circuits and Systems, 27(5):883-892, 2008. [doi]

Authors

Bo Hu

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C.-J. Richard Shi

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