Bo Hu, C.-J. Richard Shi. Simulation of Closely Related Dynamic Nonlinear Systems With Application to Process-Voltage-Temperature Corner Analysis. IEEE Trans. on CAD of Integrated Circuits and Systems, 27(5):883-892, 2008. [doi]
@article{HuS08:3,
title = {Simulation of Closely Related Dynamic Nonlinear Systems With Application to Process-Voltage-Temperature Corner Analysis},
author = {Bo Hu and C.-J. Richard Shi},
year = {2008},
doi = {10.1109/TCAD.2008.917593},
url = {http://dx.doi.org/10.1109/TCAD.2008.917593},
tags = {analysis, C++},
researchr = {https://researchr.org/publication/HuS08%3A3},
cites = {0},
citedby = {0},
journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
volume = {27},
number = {5},
pages = {883-892},
}