Vita Pi-Ho Hu, Pin Su, Ching-Te Chuang. Investigation of BTI reliability for monolithic 3D 6T SRAM with ultra-thin-body GeOI MOSFETs. In IEEE International Symposium on Circuits and Systems, ISCAS 2016, Montréal, QC, Canada, May 22-25, 2016. pages 2106-2109, IEEE, 2016. [doi]
Abstract is missing.