Ruofei Hu, Jianshi Tang, Yue Xi, Zhixing Jiang, Yuyao Lu, Chengxiang Ma, Junchen Li, Bin Gao 0006, He Qian, Huaqiang Wu. Statistical Modeling of Time-Dependent Post-Programming Conductance Drift in Analog RRAM. In IEEE International Reliability Physics Symposium, IRPS 2024, Grapevine, TX, USA, April 14-18, 2024. pages 1-6, IEEE, 2024. [doi]
Abstract is missing.