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Diagonal Symmetric Pattern-Based Illumination Invariant Measure for Severe Illumination Variation Face Recognition

Changhui Hu, Fei Wu 0004, Jian Yu, Xiaoyuan Jing, Xiaobo Lu, Pan Liu. Diagonal Symmetric Pattern-Based Illumination Invariant Measure for Severe Illumination Variation Face Recognition. IEEE Access, 8:63202-63213, 2020. [doi]

Authors

Changhui Hu

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Fei Wu 0004

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Jian Yu

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Xiaoyuan Jing

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Xiaobo Lu

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Pan Liu

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