Diagonal Symmetric Pattern-Based Illumination Invariant Measure for Severe Illumination Variation Face Recognition

Changhui Hu, Fei Wu 0004, Jian Yu, Xiaoyuan Jing, Xiaobo Lu, Pan Liu. Diagonal Symmetric Pattern-Based Illumination Invariant Measure for Severe Illumination Variation Face Recognition. IEEE Access, 8:63202-63213, 2020. [doi]

Abstract

Abstract is missing.