Changhui Hu, Fei Wu 0004, Jian Yu, Xiaoyuan Jing, Xiaobo Lu, Pan Liu. Diagonal Symmetric Pattern-Based Illumination Invariant Measure for Severe Illumination Variation Face Recognition. IEEE Access, 8:63202-63213, 2020. [doi]
@article{HuWYJLL20,
title = {Diagonal Symmetric Pattern-Based Illumination Invariant Measure for Severe Illumination Variation Face Recognition},
author = {Changhui Hu and Fei Wu 0004 and Jian Yu and Xiaoyuan Jing and Xiaobo Lu and Pan Liu},
year = {2020},
doi = {10.1109/ACCESS.2020.2983837},
url = {https://doi.org/10.1109/ACCESS.2020.2983837},
researchr = {https://researchr.org/publication/HuWYJLL20},
cites = {0},
citedby = {0},
journal = {IEEE Access},
volume = {8},
pages = {63202-63213},
}