Wenfei Hu, Zhikai Wang, Sen Yin, Zuochang Ye, Yan Wang. Sensitivity Importance Sampling Yield Analysis and Optimization for High Sigma Failure Rate Estimation. In 58th ACM/IEEE Design Automation Conference, DAC 2021, San Francisco, CA, USA, December 5-9, 2021. pages 895-900, IEEE, 2021. [doi]
@inproceedings{HuWYYW21, title = {Sensitivity Importance Sampling Yield Analysis and Optimization for High Sigma Failure Rate Estimation}, author = {Wenfei Hu and Zhikai Wang and Sen Yin and Zuochang Ye and Yan Wang}, year = {2021}, doi = {10.1109/DAC18074.2021.9586136}, url = {https://doi.org/10.1109/DAC18074.2021.9586136}, researchr = {https://researchr.org/publication/HuWYYW21}, cites = {0}, citedby = {0}, pages = {895-900}, booktitle = {58th ACM/IEEE Design Automation Conference, DAC 2021, San Francisco, CA, USA, December 5-9, 2021}, publisher = {IEEE}, isbn = {978-1-6654-3274-0}, }