Wenfei Hu, Zhikai Wang, Sen Yin, Zuochang Ye, Yan Wang. Sensitivity Importance Sampling Yield Analysis and Optimization for High Sigma Failure Rate Estimation. In 58th ACM/IEEE Design Automation Conference, DAC 2021, San Francisco, CA, USA, December 5-9, 2021. pages 895-900, IEEE, 2021. [doi]
Abstract is missing.