On the Exploitation of Narrow-Width Values for Improving Register File Reliability

Jie S. Hu, Shuai Wang, Sotirios G. Ziavras. On the Exploitation of Narrow-Width Values for Improving Register File Reliability. IEEE Trans. VLSI Syst., 17(7):953-963, 2009. [doi]

Authors

Jie S. Hu

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Shuai Wang

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Sotirios G. Ziavras

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