Jie S. Hu, Shuai Wang, Sotirios G. Ziavras. On the Exploitation of Narrow-Width Values for Improving Register File Reliability. IEEE Trans. VLSI Syst., 17(7):953-963, 2009. [doi]
@article{HuWZ09-0,
title = {On the Exploitation of Narrow-Width Values for Improving Register File Reliability},
author = {Jie S. Hu and Shuai Wang and Sotirios G. Ziavras},
year = {2009},
doi = {10.1109/TVLSI.2009.2017441},
url = {http://dx.doi.org/10.1109/TVLSI.2009.2017441},
tags = {reliability},
researchr = {https://researchr.org/publication/HuWZ09-0},
cites = {0},
citedby = {0},
journal = {IEEE Trans. VLSI Syst.},
volume = {17},
number = {7},
pages = {953-963},
}