Test-Point Selection Algorithm Using Small Signal Model for Scan-Based BIST

He Hu 0002, Yihe Sun. Test-Point Selection Algorithm Using Small Signal Model for Scan-Based BIST. In 12th Asian Test Symposium (ATS 2003), 17-19 November 2003, Xian, China. pages 507, IEEE Computer Society, 2003. [doi]

Abstract

Abstract is missing.