Mengyuan Hua, Song Yang, Jin Wei, Zheyang Zheng, Jiabei He, Kevin J. Chen. Reverse-Bias Stability and Reliability of Enhancement-mode GaN-based MIS-FET. In 13th IEEE International Conference on ASIC, ASICON 2019, Chongqing, China, October 29 - November 1, 2019. pages 1-4, IEEE, 2019. [doi]
@inproceedings{HuaYWZHC19,
title = {Reverse-Bias Stability and Reliability of Enhancement-mode GaN-based MIS-FET},
author = {Mengyuan Hua and Song Yang and Jin Wei and Zheyang Zheng and Jiabei He and Kevin J. Chen},
year = {2019},
doi = {10.1109/ASICON47005.2019.8983535},
url = {https://doi.org/10.1109/ASICON47005.2019.8983535},
researchr = {https://researchr.org/publication/HuaYWZHC19},
cites = {0},
citedby = {0},
pages = {1-4},
booktitle = {13th IEEE International Conference on ASIC, ASICON 2019, Chongqing, China, October 29 - November 1, 2019},
publisher = {IEEE},
isbn = {978-1-7281-0735-6},
}