Jiun-Lang Huang, Kwang-Ting Cheng. An On-Chip Short-Time Interval Measurement Technique for Testing High-Speed Communication Links. In 19th IEEE VLSI Test Symposium (VTS 2001), Test and Diagnosis in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA, USA. pages 380-387, IEEE Computer Society, 2001. [doi]
@inproceedings{HuangC01:8,
title = {An On-Chip Short-Time Interval Measurement Technique for Testing High-Speed Communication Links},
author = {Jiun-Lang Huang and Kwang-Ting Cheng},
year = {2001},
url = {http://csdl.computer.org/comp/proceedings/vts/2001/1122/00/11220380abs.htm},
tags = {testing},
researchr = {https://researchr.org/publication/HuangC01%3A8},
cites = {0},
citedby = {0},
pages = {380-387},
booktitle = {19th IEEE VLSI Test Symposium (VTS 2001), Test and Diagnosis in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA, USA},
publisher = {IEEE Computer Society},
isbn = {0-7695-1122-8},
}