Jiun-Lang Huang, Kwang-Ting Cheng. An On-Chip Short-Time Interval Measurement Technique for Testing High-Speed Communication Links. In 19th IEEE VLSI Test Symposium (VTS 2001), Test and Diagnosis in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA, USA. pages 380-387, IEEE Computer Society, 2001. [doi]
Abstract is missing.