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Improving ESD protection of 5V NMOSFET large array device in 0.4μm BCD process

Shao-Chang Huang, Hung-Wei Chen, Jen-Hang Yang, Mi-Chang Chang. Improving ESD protection of 5V NMOSFET large array device in 0.4μm BCD process. Microelectronics Reliability, 84:48-54, 2018. [doi]

Authors

Shao-Chang Huang

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Hung-Wei Chen

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Jen-Hang Yang

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Mi-Chang Chang

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