Improving ESD protection of 5V NMOSFET large array device in 0.4μm BCD process

Shao-Chang Huang, Hung-Wei Chen, Jen-Hang Yang, Mi-Chang Chang. Improving ESD protection of 5V NMOSFET large array device in 0.4μm BCD process. Microelectronics Reliability, 84:48-54, 2018. [doi]

Abstract

Abstract is missing.