Rei-Fu Huang, Li-Ming Denq, Cheng-Wen Wu, Jin-Fu Li. A Testability-Driven Optimizer and Wrapper Generator for Embedded Memories. In 11th IEEE International Workshop on Memory Technology, Design, and Testing (MTDT 2003), 28-29 July 2003, San Jose, CA, USA. pages 53, IEEE Computer Society, 2003. [doi]
Abstract is missing.