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An MCT-Based Bit-Weight Extraction Technique for Embedded SAR ADC Testing and Calibration

Xuan-Lun Huang, Jiun-Lang Huang, Hung-I Chen, Chang Yu-Chen, Tseng Kuo-Tsai, Ming-Feng Huang, Yung-Fa Chou, Ding-Ming Kwai. An MCT-Based Bit-Weight Extraction Technique for Embedded SAR ADC Testing and Calibration. J. Electronic Testing, 28(5):705-722, 2012. [doi]

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