Xuan-Lun Huang, Jiun-Lang Huang, Hung-I Chen, Chang Yu-Chen, Tseng Kuo-Tsai, Ming-Feng Huang, Yung-Fa Chou, Ding-Ming Kwai. An MCT-Based Bit-Weight Extraction Technique for Embedded SAR ADC Testing and Calibration. J. Electronic Testing, 28(5):705-722, 2012. [doi]
@article{HuangHCCKHCK12,
title = {An MCT-Based Bit-Weight Extraction Technique for Embedded SAR ADC Testing and Calibration},
author = {Xuan-Lun Huang and Jiun-Lang Huang and Hung-I Chen and Chang Yu-Chen and Tseng Kuo-Tsai and Ming-Feng Huang and Yung-Fa Chou and Ding-Ming Kwai},
year = {2012},
doi = {10.1007/s10836-012-5325-0},
url = {http://dx.doi.org/10.1007/s10836-012-5325-0},
researchr = {https://researchr.org/publication/HuangHCCKHCK12},
cites = {0},
citedby = {0},
journal = {J. Electronic Testing},
volume = {28},
number = {5},
pages = {705-722},
}