Der-Cheng Huang, Wen-Ben Jone, Sunil R. Das. A Parallel Built-In Self-Diagnostic Method For Embedded Memory Buffers. In 14th International Conference on VLSI Design (VLSI Design 2001), 3-7 January 2001, Bangalore, India. pages 397-402, IEEE Computer Society, 2001. [doi]
@inproceedings{HuangJD01a,
title = {A Parallel Built-In Self-Diagnostic Method For Embedded Memory Buffers},
author = {Der-Cheng Huang and Wen-Ben Jone and Sunil R. Das},
year = {2001},
doi = {10.1109/ICVD.2001.902691},
url = {http://doi.ieeecomputersociety.org/10.1109/ICVD.2001.902691},
tags = {diagnostics},
researchr = {https://researchr.org/publication/HuangJD01a},
cites = {0},
citedby = {0},
pages = {397-402},
booktitle = {14th International Conference on VLSI Design (VLSI Design 2001), 3-7 January 2001, Bangalore, India},
publisher = {IEEE Computer Society},
isbn = {0-7695-0831-6},
}