Modeling the Overshooting Effect for CMOS Inverter Delay Analysis in Nanometer Technologies - researchr publication authors

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Zhangcai Huang, Atsushi Kurokawa, Masanori Hashimoto, Takashi Sato, Minglu Jiang, Yasuaki Inoue. Modeling the Overshooting Effect for CMOS Inverter Delay Analysis in Nanometer Technologies. IEEE Trans. on CAD of Integrated Circuits and Systems, 29(2):250-260, 2010. [doi]

This author has not been identified. Look up 'Zhangcai Huang' in GoogleThis author has not been identified. Look up 'Atsushi Kurokawa' in GoogleThis author has not been identified. Look up 'Masanori Hashimoto' in GoogleThis author has not been identified. Look up 'Takashi Sato' in GoogleThis author has not been identified. Look up 'Minglu Jiang' in GoogleThis author has not been identified. Look up 'Yasuaki Inoue' in Google

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