Modeling the Overshooting Effect for CMOS Inverter Delay Analysis in Nanometer Technologies

Zhangcai Huang, Atsushi Kurokawa, Masanori Hashimoto, Takashi Sato, Minglu Jiang, Yasuaki Inoue. Modeling the Overshooting Effect for CMOS Inverter Delay Analysis in Nanometer Technologies. IEEE Trans. on CAD of Integrated Circuits and Systems, 29(2):250-260, 2010. [doi]

Abstract

Abstract is missing.