Testability Exploration of 3-D RAMs and CAMs

Yu-Jen Huang, Jin-Fu Li. Testability Exploration of 3-D RAMs and CAMs. In Proceedings of the Eighteentgh Asian Test Symposium, ATS 2009, 23-26 November 2009, Taichung, Taiwan. pages 397-402, IEEE Computer Society, 2009. [doi]

Authors

Yu-Jen Huang

This author has not been identified. Look up 'Yu-Jen Huang' in Google

Jin-Fu Li

This author has not been identified. Look up 'Jin-Fu Li' in Google