Yu-Jen Huang, Jin-Fu Li. Testability Exploration of 3-D RAMs and CAMs. In Proceedings of the Eighteentgh Asian Test Symposium, ATS 2009, 23-26 November 2009, Taichung, Taiwan. pages 397-402, IEEE Computer Society, 2009. [doi]
@inproceedings{HuangL09-4,
title = {Testability Exploration of 3-D RAMs and CAMs},
author = {Yu-Jen Huang and Jin-Fu Li},
year = {2009},
doi = {10.1109/ATS.2009.59},
url = {http://doi.ieeecomputersociety.org/10.1109/ATS.2009.59},
tags = {testing},
researchr = {https://researchr.org/publication/HuangL09-4},
cites = {0},
citedby = {0},
pages = {397-402},
booktitle = {Proceedings of the Eighteentgh Asian Test Symposium, ATS 2009, 23-26 November 2009, Taichung, Taiwan},
publisher = {IEEE Computer Society},
isbn = {978-0-7695-3864-8},
}