Yu-Jen Huang, Jin-Fu Li. Low-Cost Self-Test Techniques for Small RAMs in SOCs Using Enhanced IEEE 1500 Test Wrappers. IEEE Trans. VLSI Syst., 20(11):2123-2127, 2012. [doi]
@article{HuangL12-4,
title = {Low-Cost Self-Test Techniques for Small RAMs in SOCs Using Enhanced IEEE 1500 Test Wrappers},
author = {Yu-Jen Huang and Jin-Fu Li},
year = {2012},
doi = {10.1109/TVLSI.2011.2165568},
url = {http://dx.doi.org/10.1109/TVLSI.2011.2165568},
researchr = {https://researchr.org/publication/HuangL12-4},
cites = {0},
citedby = {0},
journal = {IEEE Trans. VLSI Syst.},
volume = {20},
number = {11},
pages = {2123-2127},
}