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Low-Cost Self-Test Techniques for Small RAMs in SOCs Using Enhanced IEEE 1500 Test Wrappers

Yu-Jen Huang, Jin-Fu Li. Low-Cost Self-Test Techniques for Small RAMs in SOCs Using Enhanced IEEE 1500 Test Wrappers. IEEE Trans. VLSI Syst., 20(11):2123-2127, 2012. [doi]

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