Maximization of power dissipation under random excitation for burn-in testing - researchr publication authors

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Kuo-Chan Huang, Chung-Len Lee, Jwu E. Chen. Maximization of power dissipation under random excitation for burn-in testing. In Proceedings IEEE International Test Conference 1998, Washington, DC, USA, October 18-22, 1998. pages 567-576, IEEE Computer Society, 1998. [doi]

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